Ivan Rodriguez Duran

Ivan Rodriguez Duran graduated with a degree in Chemistry from the Universidad Autónoma de Madrid (UAM) and a degree in Materials Engineering from the Universidad Complutense de Madrid (UCM). In 2014, he moved to Québec, where he earned a Ph.D. in Materials Engineering and Metallurgy from Université Laval.

During his doctoral research, he developed anti-fog surfaces using atmospheric-pressure plasma technology and employed a range of characterization techniques, including X-ray Photoelectron Spectroscopy (XPS), Near-Infrared Spectroscopy (NIR), Atomic Force Microscopy (AFM), and Scanning Electron Microscopy (SEM).

Following a brief experience in the field of intellectual property as a Technical Patent Agent, he joined Malvern Panalytical (Québec, Canada) in January 2021 as a Field Application Scientist.

As a member of the Malvern Panalytical Québec team, his expertise is primarily focused on materials analysis using X-ray Diffraction (XRD), as well as the development of fusion-based sample preparation methods for Inductively Coupled Plasma (ICP) and X-ray Fluorescence (XRF) analyses.